PASCAL - Pattern Analysis, Statistical Modelling and Computational Learning

EPrints submitted by Rik Fransens

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Number of EPrints submitted by this user: 9

A probabilistic approach to optical flow based super-resolution
Rik Fransens, Christoph Strecha and Luc Van Gool
In: Workshop on Generative-Model based Vision, 27 June - 2 July, 2004, Washington, USA.

Wide-baseline stereo from multiple views : a probabilistic account
Christoph Strecha, Rik Fransens and Luc Van Gool
In: IEEE computer society conference on computer vision and pattern recognition, 27 June - 2 July, 2004, Washington, USA.

Analysis of human locomotion based on partial measurements
Tobias Jaeggli, Geert Caenen, Rik Fransens, Luc Van Gool and Luc Van Gool
In: IEEE MOTION, 5-6 January 2005, Breckenridge, USA.

A hierarchical system for recognition, tracking and pose estimation
Philipp Zehnder, Esther Koller-Meier, Rik Fransens, Luc Van Gool and Luc Van Gool
In: Cognitive Vision Systems (2005) Springer , Germany .

Parametric Stereo for Multi-Pose Face Recognition and 3D-Face Modeling
Rik Fransens, Christoph Strecha, Luc Van Gool and Luc Van Gool
In: IEEE International Workshop on Analysis and Modeling of Faces and Gestures, 16 Oct 2005, Beijing, China.

Combined Depth and Outlier Estimation in Multi-View Stereo
Christoph Strecha, Rik Fransens, Luc Van Gool and Luc Van Gool
In: IEEE Conference on Computer Vision and Pattern Recognition, 17-22 June 2006, New York, USA.

A Generalized EM Approach for 3D Model Based Face Recognition under Occlusions
Michael De Smet, Rik Fransens, Luc Van Gool and Luc Van Gool
In: IEEE Conference on Computer Vision and Pattern Recognition, 17-22 June 2006, New York, USA.

A Mean Field EM-algorithm for Coherent Occlusion Handling in MAP-Estimation Problems
Rik Fransens, Christoph Strecha, Luc Van Gool and Luc Van Gool
In: IEEE Conference on Computer Vision and Pattern Recognition, 17-22 June 2006, New York, USA.

Robust Estimation in the Presence of Spatially Coherent Outliers
Rik Fransens, Christoph Strecha, Luc Van Gool and Luc Van Gool
In: IEEE Computer Society Workshop on Biometrics, 17-18 June 2006, New York, USA.