PASCAL - Pattern Analysis, Statistical Modelling and Computational Learning

Parsing with probabilistic strictly locally testable tree languages
José Luis Verdú-Mas, Rafael C. Carrasco and Jorge Calera-Rubio
IEEE Transactions on Pattern Analysis and Machine Intelligence Volume 27, Number 7, pp. 1040-1050, 2005. ISSN 0162-8828

Abstract

Probabilistic k-testable models (usually known as k-gram models in the case of strings) can be easily identified from samples and allow for smoothing techniques to deal with unseen events during pattern classification. In this paper, we introduce the family of stochastic k-testable tree languages and describe how these models can approximate any stochastic rational tree language. The model is applied to the task of learning a probabilistic k-testable model from a sample of parsed sentences. In particular, a parser for a natural language grammar that incorporates smoothing is shown.

PDF - PASCAL Members only - Requires Adobe Acrobat Reader or other PDF viewer.
EPrint Type:Article
Project Keyword:Project Keyword UNSPECIFIED
Subjects:Computational, Information-Theoretic Learning with Statistics
Natural Language Processing
ID Code:1787
Deposited By:José Luis Verdú-Mas
Deposited On:28 November 2005